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New & Topics


Display of Mössbauer Spectroscopic Microscope at Pittcon 2016 (March 6 - 10, 2016, Atlanta)

We display our developing Mössbauer Spectroscopic Microscope at Pittcon (The Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy) in March 6 - 10, 2016 at Georgia World Congress Center, Atlanta, GA USA. Pittcon is the World's Leading Conference and Exposition for Laboratory Science.

Presentation at GADEST 2015 (Sept. 20th to 25th, 2015, Bad Staffelstein, Germany)

We gave a presentation at Gettering and Defect Engineering in Semiconductor Technology (GADEST, September 20th to 25th, 2015, Bad Staffelstein, Germany).

  • Y. Yoshida, Y. Ino, K. Tanaka: “Mössbauer Spectroscopy on Fe impurities in Si materials”, Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015) (22-Sep-15, Bad Staffelstein, Germany).
  • Y. Ino, K. Tanaka, K. Sakata, Y. Yoshida: “Direct observations of Fe impurities in Si with different Fermi levels by Mössbauer spectroscopy”, Gettering and Defect Engineering in Semiconductor Technology XVI (GADEST 2015) (22-Sep-15, Bad Staffelstein, Germany).


Publication
  • Y. Yoshida, Y. Ino, K. Tanaka, "Mössbauer Spectroscopy on Fe Impurities in Si Materials", Solid State Phenomena, Vol. 242, pp. 211-217, 2016.
  • Y. Ino, K. Tanaka, K. Sakata, Y. Yoshida, "Direct Observations of Fe Impurities in Si with Different Fermi Levels by Mössbauer Spectroscopy", Solid State Phenomena, Vol. 242, pp. 205-210, 2016.

Presentation at ICAME 2015 (Sept. 13th to 18th, 2015, Hamburg, Germany)

We gave a presentation of Mössbauer spectroscopic microscope and a tutorial for di ffusion and point defects in metals and semiconductors at the International Conference on the Applications of the Mössbauer Effect (ICAME, September 13th to 18th, 2015, Hamburg, Germany).

  • Y. Yoshida: “Diffusion and point defects in metals and semiconductors (Tutorials)”, 33rd International Conference on the Applications of the Mössbauer Effect (ICAME 2015), 13-Sep-15, Hamburg, Germany).
  • Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai, K. Moriguchi, Y. Harada, and Y. Yoshida: "3D-Mössbauer Spectroscopic Microscope for mc-Si solar cell evaluation", 33rd International Conference on the Applications of the Mössbauer Effect (ICAME 2015), 18-Sep-15, Hamburg, Germany).


Publication
  • Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai, K. Moriguchi, Y. Harada, and Y. Yoshida: "3D-Mössbauer spectroscopic microscope for mc-Si solar cell evaluation", Hyperfine Interactions 237, 13 (2016).

Display of Mössbauer Spectroscopic Microscope at JASIS 2015 (Sept. 2nd to 4th, 2015 at Makuhari Messe, Japan)

We displayed our developing Mössbauer Spectroscopic Microscope at JASIS (Japan Analytical and Scientific Instruments Show) in September 2nd to 4th, 2015 at Makuhari Messe in Japan.
JASIS is one of the largest exposition in asia for analytical and scientific instruments.