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Publications


書籍等出版物

  • Defects and Impurities in Silicon Materials- An Introduction to Atomic-Level Silicon Engineering
    吉田 豊, Guido Langouche(担当:共編者(共編著者), 範囲:Lecture Note in Physics)
    Springer 2016年 (ISBN: 9784431557999)
  • Proceedings of the 65th Yamada Conference and the 31th International Conference on the Applications of the Mössbauer Effect (ICAME2011), Kobe, Japan
    吉田 豊, 壬生 攻(担当:共編者(共編著者))
    Springer 2012年
  • Mössbauer Spectroscopy-Tutorial Book
    吉田 豊, Guido Langouche(担当:共編者(共編著者))
    Springer 2012年
  • メスバウア分光入門-その原理と応用-(共著)
    藤田英一, 吉田 豊
    アグネ技術センター 1999年

論文

  • Y. Yoshida, T. Watanabe, Y. Ino, M. Kobayashi, I. Takahashi, N. Usami, “Mössbauer Spectroscopic Microscope Study on Diffusion and Segregation of Fe Impurities in mc-Si wafer”, Hyperfine Interactions 240 114 - 121 9 (2019)

  • Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, K. Matsumuro, H. Fujita, K. Ogai, K. Moriguchi, Y. Harada, H. Soejima, Y. Yoshida, “A new set-up of Mössbauer Spectroscopic Microscope to study the correlation between Fe impurities and lattice defects in Si crystals ”, Journal of Crystal Growth 468 489 - 492 12 (2016)
  • Y. Ino, T. Watanabe, K. Matsumuro, K. Hayakawa, K. Yukihira, H. Fujita, K. Ogai, K. Moriguchi, Y. Harada, H. Soejima, Y. Yoshida, “The application of Mössbauer Spectroscopic Microscope to multi-crystalline Si”, Proceedings of the 7th International Symposium on Advanced Science and Technology of Silicon Materials, (22 Nov. 2016) 11 (2016)
  • Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, H. Fujita, K. Ogai, K. Moriguchi, H. Soejima, Keiko Ogai, Yoshihito Harada, Y. Yoshida, “A new evaluation method of Fe impurities in mc-Si solar cells by Mössbauer Spectroscopic Microscope”, The 26th edition of the International Photovoltaic Science and Engineering Conference (PVSEC-26) 10 (2016)
  • Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, K. Ogai, K. Moriguchi, Y. Harada, Y. Yoshida, “3D-Mössbauer spectroscopic microscope for mc-Si solar cell evaluation”, Hyperfine Interactions 273 13 (2016)
  • Y. Yoshida, Y. Ino, K. Matsumuro, T. Watanabe, H. Fujita, K. Hayakawa, K. Yukihira, K. Ogai, K. Moriguchi, Y. Harada, H. Soejima,“Feasibility study to investigate diffusion of Fe in Si using a Mössbauer spectroscopic microscope”, Hyperfine Interactions 237 130 (2016)
  • Y. Yoshida and G. Langouche (Eds.), “Defects and Impurities in Silicon Materials- An Introduction to Atomic-Level Silicon Engineering” in Lecture Note in Physics, (2016), Springer, DOI 10.1007/978-4-431-55800-2; pp. 373, Chapter 8, G. Langouche and Y. Yoshida, “Nuclear Methods to study defects and impurities in Si materials”.
  • Y. Yoshida, Y. Ino, and K. Tanaka: Solid State Phenomena 242, 211 (2016).
  • Y. Ino, K. Tanaka, K. Sakata, Y. Yoshida, Solid State Phenomena, 242, 205 (2016).

  • Y. Yoshida, Y. Tsukamoto, M. Ichino, and K. Tanaka:“Direct Observation of Carrier Trapping Processes on Fe Impurities in mc-Si Solar Cell”,Solid State Phenomena,205-206 (2014) 40-46.
  • K. Tanaka, Y. Fujita, S. Okamura, and Y. Yoshida:“Mössbauer spectra and electric properties of 57Fe-enriched BiFeO3 Thin Films”,Jpn. J. Appl. Phys., 53 (2014).
  • K. Tanaka, Y. Tsukamoto, S. Okamura, and Y. Yoshida:“Mössbauer Spectra of 57Fe-Enriched BiFeO3 Thin Films Fabricated on SiO2/Si Substrates by Chemical Solution Deposition Process”,Key Eng. Mater.,582 (2014) 63-66.
  • Y. Ino, H. Soejima, K. Hayakawa, K. Yukihira, K. Tanaka, H. Fujita, T. Watanabe, Y. Harada, and Y. Yoshida, “Development of Mössbauer Spectroscopic Microscope to Evaluate Si Solar Cells”, Proceedings of Si-Forum 2014, Hamamatsu, (2014) 149-156.
  • K. Tanaka, T. Watanabe, T. Uenoyama, Y. Ino and Y. Yoshida, “Search for Fe-B pairs in highly B-doped Si wafers by Mössbauer Spectroscopy”, Proceedings of Si-Forum 2014, Hamamatsu, (2014) 107-111.
  • 吉田 豊:“メスバウア分光「技術の伝承」”,学振145委員会,396-401,2014年
  • Y. Yoshida, Y. Tsukamoto, M. Ichino, and K. Tanaka, “Direct Observation of Carrier Trapping Processes on Fe impurities in mc-Si Solar Cells”, Solid State Phenomena 205-206, 40-46 (2014).

  • K. Tanaka, Y. Tsukamoto, S. Okamura, and Y. Yoshida: “Observation of 57Fe-Enriched BiFeO3 Thin Films by Mössbauer Spectroscopic Microscope”, Jpn. J. Appl. Phys. 52 (2013) 09KB02

  • Y.Yoshida & G. Langouche Editors, “Mossbauer Spectroscopy-Tutorial Book”, Springer (2012)
  • K. Tanaka, Y. Tsukamoto, K. Hayakawa, and Y. Yoshida, “Characterization of 57Fe-Enriched BiFeO3 Thin Films by Mössbauer Spectroscopy.” Jpn. J. Appl. Phys., 51, (2012)
  • K. Tanaka, Y. Akiyama, K. Hayakawa, K. Yukihira and Y. Yoshida, “Mapping Analyses of Fe-diffused mc-Si using Mössbauer Microscope and Photoluminescence”, Hyperfine Interact, 206, 75-78 (2012).
  • K. Hayakawa, Y. Tsukamoto, Y. Akiyama, M. Kurata, K. Yukihira, H. Soejima, and Y. Yoshida, “Deployment of System and Technology for Mössbauer Spectroscopic Microscope”, Hyperfine Interact, 206, 79-82, (2012).
  • Y. Yoshida, K. Suzuki, Y. Kobayashi, T. Nagatomo, Y. Akiyama, K. Yukihira, K. Hayakawa, H. Ueno, A. Yoshimi, D. Nagae, K. Asahi and G. Langouche, “57Fe Charge State in mc-Si Solar cells under Light Illumination After GeV- Implantation of 57Mn”, Hyperfine Interactions, 204, (2012), 133-137.

  • *Y. Yoshida, T. Kamimura, M. Ichino, K. Hayakawa, K. Yukihira, and H. Soejima: “Mössbauer spectroscopic microscope”, J. Phys.: Conf. Ser. 217, 012003 (2010).
  • *吉田 豊、副島啓義、「顕微メスバウア分光装置の開発と応用」,表面科学Vol. 31, 255-260, (2010).
  • K. Suzuki, Y. Yoshida, M. Ichino, and K. Asahi, “Direct observation of stress-induced diffusion of iron impurities in silicon by Mössbauer spectroscopy.” Proc. of The Forum on the Science and Technology of Silicon Materials 2010, 401 (2010)
  • M. Ichino and Y. Yoshida, “In-situ observation of iron impurities in n-type silicon under UV light illumination by Mössbauer spectroscopy.” Proc. of The Forum on the Science and Technology of Silicon Materials 2010, 357 (2010).
  • K. Suzuki, Y. Yoshida, K. Hayakawa, K. Yukihira, M. Ichino, and K. Asahi, Observation of iron impurities diffusion in silicon under bending stress by Mössbauer spectroscopy, Hyperfine Interact., 197, 213-217 (2010).
  • *Y. Yoshida, K. Hayakawa, K. Yukihira, M. Ichino, Y. Akiyama, H. Kumabe, H. Soejima, “Development and Applications of Mössbauer Cameras”, Hyperfine Interactions, 198, 23-29 (2010).

  • Y. Yoshida, K. Suzuki, K. Hayakawa, K. Yukihira, H. Soejima, “Mössbauer spectroscopic microscope”, Hyperfine Interact., 188 (2009), 121-126.

  • R. Sielemann, Y. Kobayashi, Y. Yoshida, H. P. Gunnlaugsson, and G. Weyer, “Magnetism at Single Isolated Iron Atoms Implanted in Graphite”, Phys. Rev. Lett. 101, (2008) 137206. (査読有)

  • Y. Yoshida, Y. Kobayashi, K. Yukihira, K. Hayakawa, K. Suzuki, 他7名, 1番目,“57Fe diffusion in n-type Si after GeV-implantation of 57Mn” Physica B, 401–402 (2007) 101–104.(査読有)
  • Y. Yoshida, Y. Suzuki, A. Matsushita, K. Suzuki, and K. Sakata, “Fermi level dependence of Mössbauer spectroscopic components corresponding to iron interstitials and their clusters in silicon”, Physica B, 401–402 (2007) 167–170(査読有)
  • Y. Yoshida, S. Aoki, K. Sakata, Y. Suzuki, M. Adachi, and K. Suzuki, “Iron impurities in multicrystalline silicon studied by Mössbauer spectroscopy”, Physica B, 401–402 (2007) 119–122(査読有)

  • Y. Yoshida, Y. Kobayashi, K. Hayakawa, K. Yukihira, A. Yoshida, H. Ueno, F. Shimura and F. Ambe, “In-situ observation of substitutional and interstitial Fe atoms in Si after GeV-implantation: an in-beam Mossbauer study” Physica B 376-377, 69-72 (2006).
  • Y. Yoshida, S. Horie, K. Niira, K. Fukui and K. Shirasawa, “In-situ observation of iron atoms in multicrystalline silicon at 1273 K and 300 K by Mossbauer spectroscopy”, Physica B 376-377, 227-230 (2006).

  • 吉田 豊,“メスバウア分光によるシリコン中の鉄原子の拡散その場観察”,金属,74, 54-59 (2004).
  • 有川 和宏、吉田 豊,“シリコン表面近傍の汚染鉄原子の挙動:内部転換メスバウア分光による直接観察”,シリコンテクノロジー,59, 50-55 (2004).
  • Y. Yoshida, S. Ogawa and K. Arikawa, “Mossbauer Study on Fe impurities in Si Crystals”, in Proc. of the 4-th International Symposium on Advanced Science and Technology of Silicon Materials, 110-114 (2004).

  • Y. Yoshida, S. Ogawa and K. Arikawa, “Direct Observation of Substitutional Fe Atoms in Si and SOI wafers at 1273 K”, Physica B, 340-342, 605-608 (2003).
  • Y. Yoshida, “Direct Observation of Substitutional and Interstitial Fe atoms in Si by high-temperature and In-beam Mossbauer Spectroscopy”, ALTECH 2003, ECS, Salt Lake City, US, 479-482 (2003).

  • 吉田 豊,“メスバウア分光によるシリコン中の鉄原子の直接観察”,シリコンテクノロジー,42, 56-61 (2002).
  • Y. Yoshida, Y. Kobayashi, A. Yoshida, X. Diao, S. Ogawa, K. Hayakawa, K. Yukihira, F. Shimura and F. Ambe, “In-Beam Mossbauer Spectroscopy after GeV-Ion Implantation at an On-line Projectile-Fragments Separator”, Hyperfine Interactions, 141-142, 157-162 (2002).

  • S. Ogawa and Y. Yoshida, “Direct Observation of Substitutional Fe atoms in p-type Si at 1273 K”, in Proc. of the Forum on the Science and Technology of Silicon Materials, 330-331(2001).
  • Y. Yoshida, Y. Kobayashi, F. Ambe, E. Yagi, A. Seeger et.al, “Direct Observation of Self-Interstitial Motion in Pure Iron by 56Fe (d,p) 57Fe In-Beam Mossbauer Spectroscopy”, Defect and Diffusion Forum, 194-199, 29-34 (2001).
  • Y. Yoshida, Y. Kobayashi, K. Hayakawa, K. Yukihira, F. Shimura, A. Yoshida, X. Diao, H. Ogawa, Y. Yano and F. Ambe, “In-Beam Mossbauer Study on Interstitial and Substitutional 57Mn/57Fe Jumps in Si”, Defect and Diffusion Forum, 194-199, 611-616 (2001).

  • Y. Yoshida, S. Ogawa, S. Endou, T. Shimura and M. Umeno, “Direct Observation of the Gettering Processes of Fe atoms in SOI wafers by Mossbauer Spectroscopy”, in Proc. of 3rd. International Symposium on Advanced Science and Technology of Silicon Materials, JSPS, 630-635 (2000).
  • X. Diao, Y. Yoshida, K. Hayakawa, F. Shimura, et al., “Lattice Defects produced by GeV-Ion Irradiations in Si”, in Proc. of 3rd. International Symposium on Advanced Science and Technology of Silicon Materials, JSPS, 175-180 (2000).
  • Y. Kobayashi, Y. Yoshida, A. Yoshida, Y. Watanabe, K. Hayakawa, K. Yukihira, F. Shimura and F. Ambe, “In-Beam Mossbauer Study of 57Mn/57Fe in Si Following Projectile Fragmentation and Implantation”, Hyperfine Interactions, 126, 417-420 (2000).
  • Y. Yoshida, Y. Kobayashi, K. Hayakawa, K. Yukihira, F. Shimura, A. Yoshida, Y. Watanabe, X. Diao, H. Ogawa, Y. Yano and F. Ambe, “In-Beam Mossbauer Study on Interstitial and Substitutional 57Mn/57Fe Jumps in Si”, in Proc. of 3rd. International Symposium on Advanced Science and Technology of Silicon Materials, JSPS, 169-174 (2000).

  • 藤田英一,那須三郎,西田哲明,吉田 豊,「メスバウア分光入門」,アグネ技術センター,(1999).
  • 吉田 豊,”インビーム・メスバウア実験と物質科学:ナノ秒スケールのその場観察を目指して”、Materia Japan, 38, 550-554 (1999).
  • 吉田 豊,“メスバウア分光による拡散の研究-原子ジャンプのその場観察-”,日本金属学会分科会グループ「拡散研究会」活動報告書,51-65 (1999).
  • Y. Yoshida, N. Murase, “In-Situ Observation of Stress-Induced Martensite Transformation in SUS304 Stainless Steel by Mossbauer Spectroscopy”, in Proc. of JIMIC-3 Kyoto, 923-926 (1999).
  • Y. Yoshida, N. Murase, T. Kakeshita, T. Saburi, “In-Situ Mossbauer Study on the Nucleation Process of Martensitic Transformation in Fe68.3Ni31.7 Alloy”, in Proc. of JIMIC-3? Kyoto, 985-988 (1999).

  • Yoshida, “Mossbauer spectroscopy to investigate atomistic jump processes on an atomistic scale”, Hyperfine Interactions, 113, 183-198 (1998).
  • Y. Yoshida and F. Shimura, Electrochemical Society Proceedings, 98-1, 984-996 (1998), “In-Situ Observation of Diffusion and Segregation of Fe atoms in Si Crystals at High Temperature by Mossbauer spectroscopy”, (The 8th International Symposium on Silicon materials Science and Technology, San Diego May 1998).
  • Y. Kobayashi, Y. Yoshida, K. Hayakawa, K. Yukihira, J. Nakamura, H. Haslein, S. Nasu, N. Inabe, Y. Watanabe, A. Yoshida, M. Kase, A. Goto, S. Yano, E. Yagi and F. Ambe, “In-beam Mossbauer Spectroscopy for Materials Science at RIKEN Accelerator Facility”, Hyperfine Interactions, (c) 3, 273-276 (1998).
  • 吉田 豊,“SIST学生のための「量子力学」講義”,静岡理工科大学紀要、7, 183-208 (1998).

  • J. Kapoor, D. Riegel, Yi Li, C. Polaczyk, J. Andres, F. Mezei, R. Sielemann, Y. Yoshida, W. D. Brewer, L. A. de Mello and S. Frota-Pessoa, “Observation of Magnetism of Fe at an Interstitial Site in a Metal Host”, Phys. Rev. Lett., 78, 1279-1282 (1997).
  • 吉田 豊、高温メスバウア分光による拡散の測定法、Materia Japan, 36, 711-716 (1997)
  • Y. Yoshida, Y. Kobayashi, K. Hayakawa, K. Yukihira, J. Nakamura, S. Nasu, E. Yagi and F. Ambe, “In-beam Mossbauer Study on 57Fe jumps in Solid Ar and Solid Xe after Coulomb-Excitation and Recoil-Implantation”, RIKEN Review, 16, 19-20, (1997).
  • Y. Kobayashi, Y. Yoshida, K. Hayakawa, K. Yukihira, J. Nakamura, S. Nasu, N. Inabe, Y. Watanabe, A. Yoshida, M. Kase, A. Goto, S. Yano, and F. Ambe, “In-beam Mossbauer Spectroscopy of 57Fe using a 57Mn beam from RIPS of RIKEN Ring Cyclotron”, RIKEN Review, 16, 21-22, (1997).

  • H. Nakajima, S. Ohshida, K. Nonaka, Y. Yoshida, and F. E. Fujita, “Diffusion of Iron in b-TiFe Alloys”, Scripta Mat. 34, 949-953 (1996).
  • Y. Yoshida, Y. Masuda, H. Haslein, F. E. Fujita and H. Nakajima, “High Temperature Mossbauer Study on the Fast Diffusion of Fe in b-TiFe Alloys”, Defect and Diffusion Forum, 143-147, 461-466 (1996).

  • Y. Yoshida, Y. Kobayashi, K. Yukihira, K, Hayakawa, H. Haslein, F. Ambe and S. Nasu; “RIKEN-In Beam Mossbauer Spectrometer”, JHP-Supplement, 16, 28 (1995).
  • Y. Yoshida, H. Haslein, F. E. Fujita and H. Nakajima; “A Precursor Effect Followed by the Fast Diffusion of Fe in b-TiFe Alloys”, in Proc. of Int. Conf. on the Applications of the Mossbauer Effects, Rimini 201-204 (1995).

  • Y. Yoshida; “In-Beam Mossbauer Spectroscopy on Solid State Physics”, JHP-Supplement, 15, 155 (1994).

  • G. Vogl, M. Sugimoto, and Y. Yoshida; “High-temperature Observations of the Dynamics of Small Second Phase Particles Leading to Fast Diffusion of Iron in α-Zirconium”, J. Nuclear Mat., 199, 112 (1993).
  • B. Keck, R. Sielemann, and Y. Yoshida; “Iron on Substitutional and Interstitial Lattice Sites in Alkali Metals and Isomer Shift Systematics for Interstitial Iron in Elemental Metals", Phys. Rev. Lett., 71, 4178-4181(1993).

  • Y. Yoshida, P. Fratzl, G. Vogl, H. Hofer and F. Dworschak; “Radiation-induced Segregation in Proton-irradiated AuFe Studied by Mossbauer Spectroscopy” J. Phys.: Condens. Mat., 4, 2415-2428 (1992).
  • P. Fratzl, Y. Yoshida, G. Vogl and H. G. Haubold; “Phase-Separation Kinetics of Dilute Cu-Fe Alloys Studied by Anomalous Small-Angle X-Ray Scattering and Mossbauer Spectroscopy", Phys. Rev., B46, 11323-11331 (1992).

  • . Fratzl, Y. Yoshida, F. Langmayr, and G. Vogl; “Defect-mediated Nucleation of α-Fe in Au-Fe Alloy”, Phys. Rev. B44, 4192-4199 (1991).
  • R. Sielemann and Y. Yoshida; “In-Beam Mossbauer Spectroscopy at Heavy-Ion Accelerators”, Hyperfine Interactions, 68, 119-130 (1991).

  • R. Sielemann, Y. Yoshida, B. Keck, L. Wende and G. Vogl; “Mossbauer Effect Following Coulomb Excitation and Implantation: Localized and Long-range Diffusion of Interstitially Implanted Iron”, Hyperfine Interactions, 56, 1643 (1990).
  • Y. Yoshida, M. Sugimoto, D. Tuppinger and G. Vogl; “Search for Anomalously Fast Diffusion of Fe in a-Ti and a-Zr with Mossbauer Spectroscopy”, Defect and Diffusion Forum, 66-69, 347 (1990).
  • Y. Yoshida, P. Fratzl, W. Miekeley and G. Vogl; “Anomalously Fast Diffusion of Fe in Zr-Nb Alloys”, Defect and Diffusion Forum, 66-69, 353 (1990).
  • Y. Yoshida, P. Fratzl, W. Miekeley and G. Vogl; “Anomalously Fast Diffusion of Fe in Zr-Nb Alloys”, Defect and Diffusion Forum, 66-69, 353 (1990).

  • 吉田豊、「メスバウア分光による高速拡散の研究」、日本金属学会会報、28,? 610 (1989).
  • Y. Yoshida, P. Fratzl, F. Langmayr and G. Vogl; “Short-Range-Order in Au-Fe Alloys Studied by High-Temperature Mossbauer Spectroscopy”, Phys. Rev. B39, 6395-(1989).
  • Y. Yoshida; “In-Beam Mossbauer Study of Atomic Jump Processes in Metals”, Hyperfine Interactions, 47, 95-113 (1989).

  • Y. Yoshida, M. Menningen, R. Sielemann, G. Vogl, G. Weyer and K. Schroeder; “Local Atomic Jump Process of Iron in a-Zirconium”, Phys. Rev. Lett., 61, 195-198 (1988).
  • A. Heiming, K. H. Steinmetz, G. Vogl and Y. Yoshida; “Mossbauer Studies on Self-Diffusion in Pure Iron”, J. Phys. F: Metal Phys., 18, 149 (1988).

  • Y. Yoshida, W. Miekeley, W. Petry, W. Stehr, K. H. Steinmetz and G. Vogl; “Anomalously Fast Diffusion of Fe in b-Zr-Fe Alloys, A Mossbauer Study”, Mat. Sci. Forum, 15-18, 487-492 (1987).
  • M. Menningen, R. Sielemann, G. Vogl, Y. Yoshida, K. Bonde-Nielsen and G. Weyer; ”Interstitial Implantation of Iron into Aluminum”, Europhy. Lett., 3, 3-8 (1987).
  • M. Menningen, R. Sielemann, G. Vogl, Y. Yoshida, K. Bonde-Nielsen and G. Weyer; “Atomic Jump Processes in Metallic Systems”, Hyperfine Interactions, 35, 807-810 (1987).

  • Y. Yoshida, S. Nasu, F. E. Fujita, Y. Maeda and H. Yoshida, “57Fe Mossbauer Study on Point Defects in Pure a-Fe”, J. Magn. Magn. Mater., 34-35, 753-756 (1983).

  • Y. Yoshida, S. Nasu and F. E. Fujita; “ 57Fe Mossbauer Study on Point Defects in Pure Iron”, in Proc. of Int. Conf. of Yamada Conference V, 199-202 (1982).

  • S. Nasu, Y. Yoshida and F. E. Fujita; “57Fe Mossbauer Study on Fe-C Alloy System”, in Proc. of Int. Conf. on the Applications of the Mossbauer Effect, Jaipur.
  • Y. Yoshida, M. Kawakami and T. Nakamichi; ”Magnetic Properties of a Ternary Alloy Mn0.5V0.5-yAly”, J. Phys. Soc. Japan, 50, 2203 (1981).
  • M. Kawakami, Y. Yoshida, T. Nakamichi, S. Ishida and H. Enokiya; “Magnetic Properties of the Heusler Alloy Mn2VAl”, J. Phys. Soc. Japan, 50, 1041 (1981).

学会発表

  • PITTCON2016 (March 6 - 10, 2016, Atlanta, USA)にて、顕微メスバウア分光装置のプロトタイプ機およびポスター展示を行った:Spectroscopy volume 31, issue 5, pp.40-62 に掲載された。
    http://www.spectroscopyonline.com/review-new-spectroscopic-instrumentation-2016?pageID=6
  • 第63回応用物理学会春季学術講演会での発表が、Poster Awardを受賞した。
    伊野裕司, 副島啓義, 早川一生, 行平憲一, 藤田浩享, 渡辺富夫, 森口幸一, 小粥啓子, 原田芳仁,吉田豊:「多結晶Si太陽電池評価のための顕微メスバウア分光装置の開発」
  • 招待講演:吉田・伊野、信越半導体 磯部研究所にて講演 (2016年10月11日).
  • 招待講演:吉田・伊野、産業技術総合研究所 福島再生可能エネルギー研究所にて,“顕微メスバウア分光装置の開発と多結晶Si太陽電池への適用”についての講演 (2016年11月9日).

  • Y. Yoshida, Y. Ino, K. Matsumuro, T. Watanabe, H. Fujita, K. Hayakawa, K. Yukihira, K. Ogai, K. Moriguchi, Y. Harada, and H. Soejima,“Diffusion Study on Fe in Si crystals by Mössbauer Spectroscopic Microscope”, the International Conference on HYPERFINE Interactions and their Applications (HYPERFINE 2016), (07-Jul-16, Leuven, Belgium).
  • Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, K. Matsumuro, H. Fujita, K. Ogai, K. Moriguchi, Y. Harada, H. Soejima, and Y. Yoshida, “A new set-up of Mössbauer Spectroscopic Microscope to study the corre-lation between Fe impurities and lattice defects in Si crystals”, The 18th International Conference on Crystal Growth and Epitaxy (ICCGE18), ThP-G09-7, (11-Aug-16, Nagoya, Japan).
  • 伊野裕司, 松室和明, 藤田浩享, 渡辺富夫,吉田豊:「顕微メスバウア分光装置による単結晶Si中のFe拡散の研究」,第77回応用物理学会秋季学術講演会(2016年9月15日,新潟県新潟市).
  • 渡辺富夫,伊野 裕司,吉田 豊:「多結晶シリコン中の鉄不純物の挙動」,第77回応用物理学会秋季学術講演会(2016年9月15日,新潟県新潟市).
  • 藤田浩享,久保紘,吉田豊,田畑進一朗,丸山直紀:「顕微メスバウア分光装置を用いた鋼の組織観察」,日本金属学会2016年秋期講演大会(2016年9月22日,大阪府豊中市).
  • Y. Ino, T. Watanabe, K. Hayakawa, K. Yukihira, H. Fujita, K. Ogai, K. Moriguchi, H. Soejima, Keiko Ogai, Yoshihito Harada, and Y. Yoshida, “A new evaluation method of Fe impurities in mc-Si solar cells by Mössbauer Spectroscopic Microscope”, The 26th edition of the International Photovoltaic Science and Engineering Conference (PVSEC-26), 2.4.3h, (27-Oct-16, Singapore).
  • Y. Ino, T. Watanabe, K. Matsumuro, K. Hayakawa, K. Yukihira, H. Fujita, K. Ogai, K. Moriguchi, Y. Harada, H. Soejima, and Y. Yoshida, “The application of Mössbauer Spectroscopic Microscope to multi-crystalline Si”, The 7th International Symposium on Advanced Science and Technology of Silicon Materials, (22 Nov. 2016).
  • 藤田浩享,久保紘,吉田豊,田畑進一朗,丸山直紀:「メスバウア分光法を用いた鋼中の炭素挙動の観察」,日本金属学会2017年春期講演大会(2017年3月,東京都八王子市).
  • 伊野裕司, 副島啓義, 早川一生, 行平憲一, 藤田浩享, 渡辺富夫, 森口幸一, 小粥啓子, 原田芳仁,吉田豊:「顕微メスバウア分光装置による多結晶Si太陽電池での鉄不純物と結晶欠陥の観察」,第64回応用物理学会春季学術講演会(2017年3月,神奈川県横浜市).
  • 渡辺富夫,伊野裕司,吉田豊:「顕微メスバウア分光装置を用いた多結晶シリコン中の鉄不純物観察」,第64回応用物理学会春季学術講演会(2017年3月,神奈川県横浜市).

  • 招待講演:吉田・伊野、信越半導体磯部研究所にて講演(2016年10月11日).
  • 招待講演:吉田・伊野、産業技術総合研究所福島再生可能エネルギー研究所にて,“顕微メスバウア分光装置の開発と多結晶Si太陽電池への適用”についての講演(2016年11月9日).
  • 招待講演:吉田豊,「顕微メスバウア分光装置の開発と応用:シリコン中の微量鉄原子と鉄鋼材料評価」,第5回先進的放射光メスバウア分光研究会,(2017年3月2日,名古屋工業大学).
  • 招待講演:吉田豊,「顕微メスバウア分光による鉄鋼材料中の炭素原子の挙動」,日本鉄鋼協会軽元素シンポジウム,(2017年3月17日,首都大学東京 南大沢キャンパス).
  • 招待講演:Y. Yoshida: ”Mössbauer-Spectroscopic-Microscope Studies on Direct Observations of Microstructure Formation Processes in Si-solar cells and Fe-Steels with recoil-free g-ray absorptions “, September 12. 2017, an invitation to a seminar talk from Prof. Dr. Dr.h.c. Peter Fratzl, Director, Department of Biomaterials, Max Planck Institute of Colloids and Interfaces, Research Campus Golm, 14424 Potsdam, Germany.